Technical Report 98-012: TEM Length Calibrations

TEM Length Calibrations

Carmen Green

Undergraduate Research Assistant

Amy Reilein

Graduate Research Assistant

In many fields of science, it is often desirable to perform measurements on small objects. One such instrument used to make these measurements is the transmission electron microscope, or TEM. With the information available in this report, it is possible to quickly and accurately measure the dimensions of very small objects using the Philips CM 200 TEM accessible in Beckman’s Microscopy Suite.

Contents
Introduction	2
Background	3
Analysis	4
Acquiring TEM Images for Calibration & Measurement	5
Calibrating Length Measurements Using TEM Images I	6
Calibrating Length Measurements Using TEM Images II	7
Measuring Length with TEM Images	8

Imaging Technology Group
Beckman Institute for Advanced Science and Technology
University of Illinois at Urbana-Champaign
405 N. Mathews, Urbana, IL 61801
itg@itg.uiuc.edu
Technical Report 98-012

Date Issued: December 1998

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