A Testbed For Automated
Acquisition From a TEM

C. S. Potter,^*+ B. Carragher,^*+ H. Chu,^# B. J. Frey,^* R. Josephs,^@ C. Lin,^# N. Kisseberth,^*+ K.L. Miller,⁺ and K. Nahrstedt^#

^* Beckman Institute, University of Illinois at Urbana-Champaign, Urbana, IL 61801

^# Department of Computer Science, University of Illinois at Urbana-Champaign, Urbana, IL 61801

⁺ National Center for Supercomputing Applications, University of Illinois, Urbana, IL 61801

^@ Department of Molecular Genetics and Cell Biology, University of Chicago, 60637

Abstract submitted on 2/12/98 to 14th International Congress on Electron Microscopy, August 31 - September 4, 1998, Cancun, Mexico

Imaging Technology Group
Beckman Institute for Advanced Science and Technology
University of Illinois at Urbana-Champaign
405 N. Mathews, Urbana, IL 61801
Technical Report 98-003

Date Issued: March 1998

Copyright © 1998 Board of Trustees of the University of Illinois

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