Imaging
Technology
Group
ITG Home Page
Microscopy Suite
|User Information
|Calendars
|Equipment
|Software
|Techniques
|Policies
|Fees
|Helpful Links
+Contacts
Visualization Laboratory
|About
|User Information
|Calendars
|Equipment
|Software
|Policies
|Fees
+Contacts
Technology Development
|Bugscope
|Chickscope
|Remote Microscopy
|Virtual Microscopy
|3D Reconstruction
|Visualization
+Web Atlas
Publications
|Technical Reports
|NewsAtom Feed
|ForumsAtom Feed
+Papers
Exhibits
|Image of the Week
|Gallery
|Magazine Covers
+Movies
ITG Developed Software
ITG in the Media
ITG People


Search
|Advanced Search
+Search Help
 University of Illinois at Urbana-Champaign

Improving the Positional Accuracy of the Goniometer on the Philips CM Series TEM

Jim Pulokas

Research Programmer

Imaging Technology Group

Beckman Institute

22 July 1999

We have developed a method to improve the accuracy for absolute relocation of a target specimen using the goniometer on a Philips transmission electron microscope. We have achieved this by characterizing the performance of the Philips compustage, modeling its behavior and using this model to calculate the goniometer movements required for accurate target relocation. This resulted in a tenfold improvement in the accuracy of the goniometer.

The ITG is part of the Beckman Institute for Advanced Science and Technology at the University of Illinois.
Beckman Institute

University of Illinois at Urbana-Champaign Copyright 2005. All rights reserved. University of Illinois at Urbana-Champaign.
The Imaging Technology Group
405 North Mathews, Urbana IL 61801 USA
Phone: 217.244.0170    FAX: 217.244.6219    Email:  I T G