Imaging
Technology
Group
ITG Home Page
Microscopy Suite
|User Information
|Calendars
|Equipment
|Software
|Techniques
|Policies
|Fees
|Helpful Links
+Contacts
Visualization Laboratory
|About
|User Information
|Calendars
|Equipment
|Software
|Policies
|Fees
+Contacts
Technology Development
|Bugscope
|Chickscope
|Remote Microscopy
|Virtual Microscopy
|3D Reconstruction
|Visualization
+Web Atlas
Publications
|Technical Reports
|NewsAtom Feed
|ForumsAtom Feed
+Papers
Exhibits
|Image of the Week
|Gallery
|Magazine Covers
+Movies
ITG Developed Software
ITG in the Media
ITG People


Search
|Advanced Search
+Search Help
 University of Illinois at Urbana-Champaign

Measuring Surface Adhesion and Stiffness on the Nanometer Scale Using Pulsed-Force Microscopy

Dr. Glenn Fried

Joint Postdoc Associate with ITG & Dr. Paul Bohn

&

Dr. Janelle Gunther

Postdoc Associate with STM & ACS groups
Beckman Institute

21 January 1999

Pulsed force mode microscopy (PFM) is a new mode of atomic force microscopy that allows the effects of adhesion and stiffness to be separated and recorded simultaneously with topography.  It combines the advantages of the speed of contact mode with additional information on tip-sample interaction provided by force curves and materials contrast obtained from tapping mode.  The force curves are obtained by introducing a sinusoidal modulation of the z-piezo of the AFM with an amplitude between 10 to 500 nm and frequency between 100 Hz and 5 kHz.  This allows the user to make adjustments for delicate samples.  This forum will present the theory of Pulsed Force AFM along with examples taken from experiments on the Beckman Institute's new instrument.

This page begins the HTML/XML version of the forum slides. A copy of the original presentation, in PowerPoint 2000 format, is available online.