Magnetic and Electronic Force Microscopy using the AFM

Dr. Janelle Gunther

Post Doctorate Research Associate
Beckman Institute STM & ACS Groups

17 September 1998

Atomic force microscopy (AFM) is a powerful tool for imaging sample Topography with sub-angstrom vertical resolution. In recent years, AFM Technology has expanded considerably. Imaging capabilities now include Magnetic and electric force microscopy. Magnetic force microscopy (MFM) utilizes a ferromagnetic probe to map the magnetic field gradient close to the sample surface. Applications include the study of magnetic structures or phases in various materials and alloys as well as assessing the performance of recording devices. It is also possible to image biological samples such as magnetotactic bacteria. Electric Force microscopy (EFM) is a similar technique which measures the magnetic field gradient and distribution above the sample surface. Semiconductor failure analysis, superconductor characterization and composite material analysis are some of the applications of this technique. During this presentation, the underlying principles of these techniques will be discussed along with examples and applications related to the Beckman Institute's research themes.