Scanning Probe Microscopy (SPM)

• A family of microscopy forms where a sharp probe is scanned across a surface and some tip/sample interactions are monitored

• Scanning tunneling Microscopy (STM)

• Atomic Force Microscopy (AFM)

  • contact mode
  • non-contact mode
  • TappingMode

• Other forms of SPM

  • Lateral force
  • Force modulation
  • Magnetic or electric force
  • surface potential
  • scanning thermal
  • phase imaging

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