Introduction to Atomic Force Microscopy

Dr. Janelle Gunther

Post Doctorate Research Associate
Beckman Institute STM & ACS Groups

10 March 1998

This presentation will serve as an introduction to atomic force microscopy (AFM). The Digital Instruments Multimode AFM, available in the Beckman Institute's microscopy suite, is capable of performing a variety of functions. It can perform a wide range of scanning probe techniques for examination of surfaces. These include changes in topography, elasticity, friction, adhesion as well as magnetic and electrical properties. This instrument is also capable of imaging solid surfaces in a liquid medium which is useful for studyng liquid-solid interfacial phenomena as well as biological samples.