Image of the Week - 29 November 2005

Comparison of Backscatter and Secondary Imaging Using the SEM

These two images, taken at 20 kV with a spot size of 2.6 nm, illustrate the capability of backscattered electron imaging (left panel) to reveal details not readily apparent in secondary electron imaging (right panel). The sample is diatomaceous earth, sometimes used as a fine polishing agent. Original magnification ~10,000x.

Image Courtesy: Aylin Sendemir, Tissue Engineering Group

Contact: sendemir@uiuc.edu