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 University of Illinois at Urbana-Champaign

Image of the Week - 18 November 2003

Click for Largest Version.

Carbon Fringe in the TEM

This micrograph of carbon fringes at high magnification demonstrates the imaging capability of the CM200 TEM when the instrument is properly adjusted at its highest possible accelerating voltage. The micrograph was taken using the TVIPS 2k x 2k digital camera.

Image Courtesy: Brian Batzka, FEI Company

Contact: bbatzka@feico.com

<< 11 November 2003
<< Gallery 2003 		Copyright © 2003 Brian Batzka, FEI Company; Imaging Technology Group; Beckman Institute; and the University of Illinois. The Image of the Week may not be reproduced without the prior permission of the Imaging Technology Group or the image author. 02 December 2003 >>
Gallery 2003 >>

The ITG is part of the Beckman Institute for Advanced Science and Technology at the University of Illinois.
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