Image of the Week - 22 April 2003

Scanning Electron Microscopy Without the 'Scope

The Imaging Technology Group has received a grant from NASA to develop a Virtual Scanning Electron Microscope (VSEM), which will be used by schoolchildren to view insect and material samples. Each sample will consist of a matrix of images at various magnifications and positions that will be displayed using a Bugscope-like observer station. These images, taken using the ESEM, are part of the dataset.

Image Courtesy: Glenn Fried

Contact: gfried@uiuc.edu